Beilstein J. Nanotechnol.2012,3, 198–206, doi:10.3762/bjnano.3.22
Lennard-Jones and Derjaguin–Muller–Toporov forces.
Keywords: AFM; atomic force microscopy; bimodal AFM; frequency shift; integralcalculusapplications; Introduction
Since the invention of the atomic force microscope (AFM) [1], numerous AFM studies have been pursued in order to extract information from
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Figure 1:
(a) Scheme of the first two eigenmodes of a cantilever and the tip deflection under bimodal excitat...